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KMID : 0363720090420020073
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Korean Journal of Anatomy
2009 Volume.42 No. 2 p.73 ~ p.81
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The High-Voltage Electron Microscopy in The High-Voltage Electron Microscopy in
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Kim Hyun-Wook
Rhyu Im-Joo
Kim Jee-Woong
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Abstract
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Transmission electron microscopy (TEM) provides high resolution images, which are useful in studying ultrastructure of cells and tissues. We have to use very thin section about 60~100 nm thickness due to poor penetration power of the conventional TEM at 100 kV. To overcome this limitation, TEMs using higher accelerating voltage have been developed. TEMs can be categorized into conventional TEM, intermediate TEM, high voltage TEM (HVEM), and ultrahigh voltage TEM according to their accelerating voltage. HVEM using 500~1,000 kV has an enough penetration power to observe thick specimen up to 3~4 μm, which is useful understanding 3 dimensional configuration of the cell and tissue. HVEM was built up in Korea Basic Science Institute (KBSI, Daejeon, Korea) at 2004, maximum accelerating voltage is 1.3 MV in Korea. Many results showed up to the present various fields of science such as medical science, biology, agriculture and so on. Here, we briefly summarize recent biomedical applications of HVEM to provide an insight of HVEM for morphologist.
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KEYWORD
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High voltage electron microscopy, Three-dimensional reconstruction, Tilting electron tomogram, Stereo paired image
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